Two events NOT to be missed at #IEEE_ESP are ‘bookending’ Standards Week.

Monday: EM Risk Management – Introduction to IEEE P1848 and the Need for It
Friday: Guide to IEEE P370 Standard

These two standards projects, which will be going live during 2019 are important ground breaking standards in the fields of EMC and Signal and Power Integrity.

These standards address some significant challenges that society and the profession face. Our voracious appetite for data and bandwidth means that we are producing circuits running at higher frequencies and those circuits MUST behave in a known and predictable way. However, we lack key techniques to verify the quality of those circuits. Another challenge is that systems and environments are now too complex to be able to rely on a single EMC test for high confidence in its behaviour. We are more reliant on ‘technology’ to provide safety critical functions in emerging technologies such as autonomous vehicles. The effect of electromagnetic interference through the life of the system needs to be accounted for so there is a high confidence that there will be no more safety risks in ten years than there were on day one.

Hence, enter:

IEEE Standards Project 370: Standard for Electrical Characterization of High Frequency Interconnects at Bandwidths up to 50 GHz

The need for accurate interconnect measurements is becoming critical. However, standard practices are lacking on how to measure interconnect at high frequencies: Most instruments (such as VNA’s, TDR/TDT’s) can make good measurements at the end of a coaxial interface. However, test fixtures need to be inserted between an instrument’s coaxial interface and the DUT (PCB, package, connector, cable, etc.). A poorly designed test-fixture can lead to inaccurate de-embedded S- Parameters.  The purpose of this standard is to define methodologies by which high quality scattering parameters (S-Parameters) can be obtained for electrical interconnects that are intended to operate at microwave frequencies (up to 50 GHz). The standard methodology includes requirements for designing test fixtures, for performing the measurements, for removing test fixture and instrumentation effects, and for verifying the quality of the final S-Parameters.
If your work requires S-parameter measurements where your measurements and calibration plane are not the same, you should come to hear about P370. 



IEEE Standards Project 1848: Standard for Techniques & Measures to Manage Functional Safety and Other Risks with Regard to Electromagnetic Disturbances

This standard addresses the assessment and application of techniques and measures that can help reduce the risks associated with the interfering effects of electromagnetic disturbances on digital electronic systems, especially safety- or mission-related systems. These are addressed with a focus on all types of errors, malfunctions or failures in products, equipment and systems that employ modern digital technologies (i.e. hardware and software).  (More information about the actual techniques will be discussed in the Thursday afternoon session)
If you are involved in the design and development of equipment that might have safety or functional safety related aspects, you should come to hear about P1848. 

Join us at Standards Week, find out about these standards, ask questions and discuss how these standards can help you in your workplace. 




The template file for presenters can be found here. The screen size is 16:9 widescreen.



Please send your submissions to:
Alistair Duffy

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