EXPERIMENTS & DEMONSTRATIONS

EXPERIMENTS & DEMONSTRATIONS

EMC+SIPI 2019 TECHNICAL SESSIONS SCHEDULES

View the Technical Program Schedules at a Glance

View the Full Technical Program Details in the Final Program

 

EMC and SIPI hardware experiments and demonstrations continue to be a very popular symposium event, and the EMC+SIPI 2019 will be no exception. The event’s purpose is to demonstrate important, fundamental EMC and SIPI topics and contemporary areas of interest through practical experiments and demonstrations that may be based on hardware configurations, software programming, or a combination of both.

THE FOLLOWING PRESENTATIONS ARE PLANNED FOR NEW ORLEANS

What Every Scope User Needs to Know About Transmission Lines: A Measurement Paradox to Astound and Amuse You
Eric Bogatin, Teledyne LeCroy, Boulder, CO, USA

Measure Ground Bounce Due to IC Packages and Board Routing Errors
Eric Bogatin, Teledyne LeCroy, Boulder, CO, USA

How to Measure the Real Rail Voltage on Your Board and Not the Near Field RF Noise
Eric Bogatin, Teledyne LeCroy, Boulder, CO, USA

Measurements of Conducted Emission in Real-Life Applications
Vladimir Kraz, OnFILTER, Santa Cruz, CA, USA

Full Wave Simulation of a VTEM Cell
Teona Jobava, EMCoS LLC, Tbilisi, Georgia

Electromagnetic Emission – Measurements Without an Anechoic Chamber
Sven Koenig, Langer EMV-Technik GmbH, Bannewitz, Germany

Control of Electric and Magnetic Radiated Emissions at Low and High Frequencies
Pablo Narvaez, Katherine Dang, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, CA, USA

EMC Analysis of Cable Harnesses for Aerospace and Automotive Applications
Martin Vogel, Altair Engineering, Inc., Hampton, VA, USA

Non-Ideal Behavior of the Four Passive Circuit Components: R, L, C, and a PCB Trace
Bogdan Adamczyk, Dimitri Haring, EMC Center - Grand Valley State University, Grand Rapids, MI, USA

Now You Hear Me, Now You Don’t - An Audible Presentation of Shielding Principles and Pitfalls for Non-EMC Engineers and Students
P. Gideon Wiid, Stellenbosch University / South African Radio Astronomy Observatory, Stellenbosch, South Africa

Finding Resonances in Troubleshooting EMI/EMC Problems
Arturo Mediano, University of Zaragoza, Zaragoza, Spain

Common Mode Conducted Emissions Measurements – Pitfalls and How to Avoid Them
John McCloskey, Jen Dimov, NASA/Goddard Space Flight Center, Greenbelt, MD, USA

Real-time FFT-Based EMI Measurement for MIL461G, CISPR and ANSI, Theory and Practical Application
Arnd Frech, Stephan Braun, Gauss Instruments, Munich, Germany

Reverberation Chamber Stirring Techniques and Antenna Effects
Steve Frierson, V Technical Textiles Inc, Palmyra, NY, USA
Dennis Lewis, The Boeing Company, Seattle, WA, USA

Hybrid Simulation Techniques for Multi-scale Electromagnetic Analysis
Jason Bommer, ANSYS, Inc., PA, USA

Debugging a Failed EMC Chamber above 1 GHz Using Time Domain Measurements
Zubiao Xiong and Zhong Chen, ETS-Lindgren, Cedar Park, TX, USA

Conducted RF Immunity Testing per IEC 61000-4-6
Ross Carlton, ETS-Lindgren, Cedar Park, TX, USA

FCC Part 30 Emissions Measurements for 5G FR2 Devices
James Young, ETS-Lindgren, Cedar Park, TX, USA

NFC/RFID Box & EMC Design Your Filter
Jared Quenzer, Field Application Engineer Würth Elektronik eiSos, Watertown, SD, USA
Antonio Alcarria, Würth Elektronik eiSos, Waldenburg, Baden-Württenberg, Germany

EMC Sniffer & EMC Box
Jared Quenzer, Field Application Engineer Würth Elektronik eiSos, Watertown, SD, USA
Antonio Alcarria, Würth Elektronik eiSos, Waldenburg, Baden-Württenberg, Germany

S-Parameter Assessment with the IEEE P370 Briefcase
Se-Jung Moon, Intel, Hillsboro, OR, USA
Jason Ellison, Amphenol ICC, Dillsburg, PA, USA

Test Fixture De-Embedding Verification with the IEEE P370 Plug-and-Play Kit
O.J. Danzy, EEsof EDA 

Experiments & Demos


POWERPOINT TEMPLATE

The template file for presenters can be found here. The screen size is 16:9 widescreen.

POWERPOINT TEMPLATES

Please send your submissions to:
Experiments and Demonstrations Co-Chairs:

Sam Connor:
sconnor@ieee.org

Bob Scully:
bob.scully@ieee.org

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